For logical standard cell libraries, at advanced technology node a smaller area for a standard cell and the feasibility of its routing through has become more contrary and hard to satisfy simultaneously. To achieve these, semiconductor manufactories reduce the transistor size every other year. By using this pin routability and pin access analysis flow, we are able to improve the library quality and performance.Ĭonsumer electronics require better performance and lower power consumption. On pin routability analysis, critical pin points (placing via on this point would lead to failed via insertion) will be searched out for either layout optimization guide or set as OBS for via insertion blocking. Based on the score, the “bad” pins can be found and modified. For accessibility, the systematic calculator which assigns score for each pin will search the available access points, consider the surrounded router layers, basic design rule and allowed via geometry. In this paper, we will introduce a holistic approach for the pin accessibility scoring and routability analysis. If this issue can’t be found and resolved during the cell design stage, the pin access problem will be very difficult to be fixed in implementation stage and will make the low efficiency for routing. At advanced process nodes, especially at sub-28nm technology, pin accessibility and routability of standard cells has become one of the most challenging design issues due to the limited router tracks and the increased pin density.
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